Observation Of Dielectric Relaxor Behavior In Pb0.95Sr0.05(Zr0.5Ti0.5)O3 Ceramics
Nawnit Kumar1, Patri Tirupathi2, Bineet Kumar3, Mukul Pastor4*, A. C. Pandey4, R. N. P. Choudhary5
1Department of Physics, Indian Institute of Technology, Kharagpur 721302, India
2Department of Physics, Rajiv Gandhi universities of knowledge Technologies, RK Valley 516329, India
3Department of Physics, Acharya Narendra Dev College, University of Delhi, New Delhi 110019 India
4Department of Physics, Bundelkhand University, Jhansi (U.P.) 284002, India
5Department of Physics, Institute of Technical Education and Research SOA University, Bhubaneswar 751 030, India
Adv. Mater. Lett., 2015, 6 (4), pp 284-289
Publication Date (Web): Mar 21, 2015
Copyright © 2019 VBRI Press
We reports structural, microstructural and dielectric characteristics of Sr2+ doped PZT (50/50) ceramic. X-ray diffraction reveals that the system exhibit coexistence of two phases (Tetragonal and rhombohedral) at room temperature. Typical relaxor behavior was observed by the dielectric studies and confirmed by Vogul-Fulcher fitting. The observed relaxor was predicted as existence of nanopolar regions due to short range ordering in presence of oxygen vacancies. The evidence for oxygen vacancies was studied by conductivity and polarization studies. Moreover, at 270 °C one more phase transition is noted which was ascribed to structural phase transition. Present study has scientific significance to distinguish the performance of oxygen vacancies in ferroelectric materials.
Phase transition, hysteresis, oxygen vacancy, conductivity.