Synthesis And Electrical Properties Of Sr(Bi0.5V0.5)O3 Electroceramic
B. C. Sutar1, Piyush R. Das2, R. N. P. Choudhary2*
1Department of Physics, Hi-Tech College of Engineering, Bhubaneswar, India
2Department of Physics, Institute of Technical Education and Research, Siksha ‘O’ Anusandhan University, Bhubaneswar 751030, India
Adv. Mater. Lett., 2014, 5 (3), pp 131-137
Publication Date (Web): Feb 02, 2014
Copyright © 2019 VBRI Press
Lead-free polycrystalline material Sr(Bi0.5V0.5)O3 was prepared using a high- temperature solid state reaction technique (calcinations and sintering temperature =850 and 950 oC, respectively) using high-purity ingredients. The formation of the material in the monoclinic crystal structure was confirmed by preliminary X-ray structural analysis with room temperature data.The nature of microstructure obtained by scanning electron microscopy (SEM) shows that the compound has well defined grains which are uniformly distributed throughout the surface of the sample. Detailed studies of dielectric and impedance properties of the material carried out in the frequency range of 1 kHz –1MHz at different temperatures (300C to 4550C) have provided many interesting properties. Detailed studies of dielectric properties of the compound showed an existence of diffus e phase transition around 2580C. The temperature dependence of electrical parameters (impedance, modulus etc.) of the material exhibits a strong correlation of its microstructure with the electrical parameters. The negative temperature coefficient of resistance (NTCR) behavior also was observed in the material. The complex electric modulus analysis indicates the presence of hopping conduction mechanism in the system with non-exponential type of conductivity relaxation. The nature of variation of dc conductivity with temperature confirms the Arrhenius behavior of the material. The ac conductivity spectra show a typical signature of an ionic conducting system, and are found to obey Jonscher’s universal power law.
Electroceramics, impedance analysis, X-ray diffraction, electric modulus analysis.