High stability field emission from zinc oxide coated multiwalled carbon nanotube films High stability field emission from zinc oxide coated multiwalled carbon nanotube films
Nanostech Laboratory, Department of Physics, Indian Institute of Technology Delhi, New Delhi 16, India
Adv. Mater. Lett., 2013, 4 (11), pp 849-855
Publication Date (Web): Nov 02, 2013
Copyright © IAAM-VBRI Press
A comparative study of electron field emission (FE) property of pristine mutiwalled carbon nanotubes (p-CNTs), zinc (Zn) coated CNTs (Zn-CNT), zinc oxide (ZnO) coated CNTs (ZnO-CNT) is reported. CNTs were synthesized on p-type Si (100) by microwave plasma enhanced chemical vapor deposition (MPECVD) method and the sample was divided into three parts. On two of these parts, a thin layer (~ 4nm) of Zn film was deposited. One of these (Zn-CNT) was kept for analysis and the other one was annealed in oxygen (O2) atmosphere at 520° C for 60 minutes to get ZnO coated CNT film (ZnO-CNT). Scanning electron microscope (SEM) analysis confirmed CNT formation as well as Zn and ZnO coating on the top of p-CNT films. Further, energy-dispersive X-ray spectroscopy (EDX) results confirmed the presence of zinc and oxygen in these two samples. A detailed field emission study performed in these films give following results: (i) lowest turn-on field (electric field required to produce 10 μA/cm2 current density) and threshold fields (electric field required to produce 100 μA/cm2 current density) for pristine sample (3.3 V/μm and 5.1 V/μm respectively), followed by ZnO-CNT sample (3.7 V/μm and 6.3 V/μm respectively); (ii) highest temporal stability in current density versus field (J-E characteristics) in ZnO-CNT film as compared to other two, (iii) highest field enhancement factor in ZnO-CNT films as compared to other two. The FE results are correlated with microstructures of the samples as revealed by micro-Raman spectroscopy and transmission electron microscopy (TEM) studies.
Carbon nanotube, field emission, raman spectroscopy, zinc oxide, TEM.