Max Planck Institute for Solid State Research, Heisenbergstrasse 1, D-70569 Stuttgart, Germany
Adv. Mater. Lett., 2013, 4 (11), pp 823-826
Publication Date (Web): Nov 02, 2013
Copyright © IAAM-VBRI Press
Thin films of La0.9Ca0.1MnO3 with thicknesses in the range of 40-200 nm grown on (100) SrTiO3 employing pulsed laser deposition (PLD) technique have been investigated by measuring structure and transport properties. The structural properties of the films were studied by X-ray diffraction (XRD) technique employing 2ï
Perovskite manganites, polycrystalline ceramics, magnetoresistance effect, transport mechanism.