1Materials Science Group, Inter University Accelerator Centre, Aruna Asaf Ali Marg New Delhi 110 067, India
2Department of Electronic Science, Maharaja Agrasen College University of Delhi 110 096, India
3Department of Physics, Gurukula Kangri University, Haridwar 249 404, India
Adv. Mater. Lett., 2013, Ion Beam Special Issue, 4 (6), pp 423-427
DOI: 10.5185/amlett.2012.ib.107
Publication Date (Web): Mar 16, 2013
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E-mail: vinod.phy@gmail.com
Swift heavy ion (SHI) induced modification in structural and optical properties of undoped and doped nanocrystalline (nc) ZnO films deposited by sol-gel method are investigated. These nanocrystalline films were irradiated by MeV ions of Au, Ag and Ni at various ion fluences. The structural properties were studied using X-ray diffraction and it shows that the average crystallite size of ZnO films is observed to increase by the irradiation. The atomic force microscopy (AFM) study of films shows that the roughness of the films varies with increase in the fluence. A maximum transmittance is observed to be 85% in the visible region for doped films. It is also shown that the bandgap of undoped and doped ZnO films is varied using SHI irradiation. The modifications of structural and optical properties are explained in terms of thermal spikes induced by SHIs.
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