Dielectric properties; electrical properties; X-ray diffraction; scanning electron micrographs. Dielectric properties; electrical properties; X-ray diffraction; scanning electron micrographs.
1University Department of Physics, V. K. S. University, Ara 802301 Bihar, India
2Department of ceramics and glass engineering and CICECO, University of Aveiro, 3810-193 Aveiro, Portugal
Adv. Mater. Lett., 2012, Current Issue, 3 (4), pp 315-320
Publication Date (Web): Jul 22, 2012
Copyright © IAAM-VBRI Press
Polycrystalline samples of BaFe0.5Nb0.5O3 and (1-x)Ba(Fe0.5Nb0.5)O3-xBaTiO3, [referred as BFN and BFN-BT respectively] (x = 0.00, 0.15 and 0.20) have been synthesized by a high-temperature solid-state reaction technique. The formation of the compound was checked by an X-ray diffraction (XRD) technique. The microstructure analysis was done by scanning electron micrograph. The spectroscopic data presented in impedance plane show the grain and grain boundary contributions towards electrical processes in the form of semi-circular arcs. Detailed studies of dielectric and impedance properties of the materials in a wide range of frequency (100Hz–5MHz) and temperatures (30-282°C) showed that these properties are strongly temperature and frequency dependent.
Dielectric properties, electrical properties, X-ray diffraction, scanning electron micrographs.