Cover Page September-2012-Advanced Materials Letters

Advanced Materials Letters

Volume 3, Issue 4, Pages 297-304, September 2012
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Optical And Electrical Properties Of Si Nanocrystals Embedded In SiC Matrix

Rimpy Shukla1,3,*, C. Summonte1, M. Canino1, M. Allegrezza1, M. Bellettato1, A. Desalvo2, D. Nobili1, S. Mirabella2, N. Sharma3, M. Jangir3, I. P. Jain3

1CNR-IMM, via Gobetti 101-40129 Bologna, Italy

2CNR-IMM, via Santa Sofia 64-95123 Catania, Italy

3Centre for Non-Conventional Energy Resources, University of Rajasthan, Jaipur, India

Adv. Mater. Lett., 2012, 3 (4), pp 297-304

DOI: 10.5185/amlett.2012.5346

Publication Date (Web): Jul 22, 2012



Silicon nanocrystals (Si NCs) embedded in a dielectric matrix showing tunable band gap properties have recently emerged as attracting top absorbers in silicon based high efficiency multijunction devices. This paper presents optical and electrical characterization of Si NCs in SiC matrix resulting from annealing at 1100°C of silicon-rich carbide (SRC)/SiC multilayers produced by Plasma Enhanced Chemical Vapour Deposition (PECVD), varying either the Si content in the SRC or the SiC thickness. Simulation of Reflectance and Transmittance spectra in the UV-Vis revealed that 1) the Si crystallization increases with increasing Si content; 2) a severe shrinkage of the multilayers occurs upon annealing due to the release of hydrogen and to crystallisation; 3) the growth of nanocrystals is affected by atomic environment and diffusivity of involved atoms at the investigated temperature. Temperature dependent conductivity measurements are performed on multlayers and on reference layers. The results show evidence of defect state conduction in the SiC matrix. 


Si nanodots, SiC, optical reflectance and transmittance, electrical conductance.

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