Study Of Surface Morphology And Grain Size Of Irradiated MgO Thin Films

¹Inter University Accelerator Centre, Aruna Asaf Ali Marg, New Delhi 110067, India

²Depertment of Chemistry, MMH College Ghaziabad (CCS University, Meerut), Uttar Pradesh 201001, India

³Nano Analysis Center, Korea Institute of Science and Technology (KIST), Seoul 136 791, Republic of Korea

Adv. Mater. Lett., 2012, 3 (2), pp 112-117

DOI: 10.5185/amlett.2012.1307

Publication Date (Web): Apr 14, 2012

Copyright © IAAM-VBRI Press

E-mail: jitendra_singh2029@rediffmail.com

Abstract

Present work reports 200 MeV Ag¹⁵⁺ irradiation induced effects on the surface morphology, grain size and local electronic structure in MgO thin films deposited by e-beam evaporation under ultra High vacuum. The grain size was found to decrease from 37 nm (pristine film) to 23 nm for the sample irradiated with fluence of 1×10¹² ions/cm² and thereafter it increases upto fluence of 5×10¹² ions/cm². Similar changes with ion fluence were also observed for surface roughness. Shifting and disappearance of peaks in X-ray absorption spectra with irradiation shows the electronic structure modification after irradiation. The detailed analysis of observed results has been done on the basis of existing theories.

Keywords

MgO, atomic force microscopy, X-ray absorption spectroscopy