Dielectrics; electrical properties, X-ray diffraction, scanning electron micrographs Dielectrics; electrical properties, X-ray diffraction, scanning electron micrographs
aUniversity Department of Physics, V.K.S.University, Ara. 802 301. India.
bDepartment of ceramics and glass engineering and CICECO, University of Aveiro, 3810-193 Aveiro Portugal.
Adv. Mater. Lett., 2010, 1 (1), pp 79-82
Publication Date (Web): Apr 08, 2012
Copyright © IAAM-VBRI Press
The polycrystalline samples of the pyrochlore-type Dy2(Ba0.5R0.5)2O7 (R = W, Mo) compounds have been prepared by a high-temperature solid-state reaction technique. Preliminary X-ray diffraction (XRD) studies and scanning electron micrographs (SEM) of the compounds at room temperature suggested that compounds have single phase orthorhombic crystal structures and grain distribution throughout the surface of the samples was uniform. Dielectric studies (dielectric constant (e´) and tangent loss (tan δ) obtained both as a function of frequency (4 kHz-1 MHz) at room temperature (RT) and temperature (RT 320 0C) at 20 kHz and 100 kHz suggest that compounds do not have dielectric anomaly in the said frequency and temperature range.
Dielectrics, electrical properties, X-ray diffraction, scanning electron micrographs