Dielectric Relaxation and Suitability of Scaling parameters study on Mn0.7+xZn0.3SixFe2-2xO4 (x = 0.0 - 0.3) Ferrites

Nimish H. Vasoya1, Kiran G. Saija2, Akshay R. Makadiya3, Tushar K. Pathak4, Urmila M. Meshiya3, Pooja Y. Raval3, Kunal B. Modi3,*

1Department of Balbhavan, Children's University, Sector-20, Gandhinagar 382021, India

2Smt. R.P.Bhaloida Mahila College, Upleta 360490, India

3Department of Physics, Saurashtra University, Rajkot 360005, India

4Department of Physics, Government Engineering College, Kankot, Rajkot 360005, India

Adv. Mater. Lett., 2020, 11 (12), 20121587

DOI: 10.5185/amlett.2020.121587

Publication Date (Web): Nov 09, 2020

E-mail: kunalbmodi2003@yahoo.com


The compositional dependence of the real (ε') and imaginary (ε'') parts of complex dielectric permittivity (ε*) and loss tangent (tan d) for Mn0.7+xZn0.3SixFe2-2xO4 (x = 0.0, 0.1, 0.2 and 0.3) spinel ferrite series was investigated over wide frequency (f = 20 Hz to 1 MHz) and temperature (T = 300 K to 673 K) ranges. Frequency dependence of ε',ε'' and tan δ has been explained based on the two-layer model of dielectrics. The nonlinear relationship between ε'(f) and σ'(f) suggests multi-relaxation process and formation of a broad hump in ε'(f, T) plots indicates collective contributions from electrons and holes to the polarization. The scaling by normalized frequency (f/fc) and scaled frequency (f/σdc) are found successful for ε' in high-frequency regime only while scaling found successful for ε'' over the whole range of frequency. The suitability of various scaling parameters was also tested for the master curve generation. The co-existence of localized and delocalized relaxations is verified.


Ferrites, dielectric properties, dielectric relaxation, scaling.

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