1Department of Balbhavan, Children's University, Sector-20, Gandhinagar 382021, India
2Smt. R.P.Bhaloida Mahila College, Upleta 360490, India
3Department of Physics, Saurashtra University, Rajkot 360005, India
4Department of Physics, Government Engineering College, Kankot, Rajkot 360005, India
Adv. Mater. Lett., 2020, 11 (12), 20121587
Publication Date (Web): Nov 09, 2020
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The compositional dependence of the real (ε') and imaginary (ε'') parts of complex dielectric permittivity (ε*) and loss tangent (tan d) for Mn0.7+xZn0.3SixFe2-2xO4 (x = 0.0, 0.1, 0.2 and 0.3) spinel ferrite series was investigated over wide frequency (f = 20 Hz to 1 MHz) and temperature (T = 300 K to 673 K) ranges. Frequency dependence of ε',ε'' and tan δ has been explained based on the two-layer model of dielectrics. The nonlinear relationship between ε'(f) and σ'(f) suggests multi-relaxation process and formation of a broad hump in ε'(f, T) plots indicates collective contributions from electrons and holes to the polarization. The scaling by normalized frequency (f/fc) and scaled frequency (f/σdc) are found successful for ε' in high-frequency regime only while scaling found successful for ε'' over the whole range of frequency. The suitability of various scaling parameters was also tested for the master curve generation. The co-existence of localized and delocalized relaxations is verified.
Ferrites, dielectric properties, dielectric relaxation, scaling.