Structural, electronic and magnetic investigations on PLD based La2Ni1-xFexMnO6 disordered thin film Structural, electronic and magnetic investigations on PLD based La2Ni1-xFexMnO6 disordered thin film
Department of Physics, The Institute of Science, 15 Madam Cama Rd, Mumbai, 400020, India
Adv. Mater. Lett., 2017, 8 (10), pp 958-964
Publication Date (Web): Jul 22, 2017
Copyright © IAAM-VBRI Press
The double perovskite materials show the magnetic semiconductor, magneto-optic and magneto-capacitance like interesting properties. It is predicted that the B-site substitution in this system may results in interesting properties. La2Ni1-xFexMnO6 thin films are deposited on Pt/Ti/ Si(100) substrate by Pulse Laser Deposition (PLD) technique. The films were uniform, fine grain and stoichiometric deposited at very low O2 pressure. The XRD of La2Ni1-xFexMnO6 thin films exhibits rhombohedral (R-3) phase. The peak broadening appears in Raman spectra at antistretching (518 cm-1) and stretching (656 cm-1) modes with presence of overtone modes at 1308 cm-1 in La2Ni1-xFexMnO6 thin film samples. XPS analysis reveals the presence of La3+, NiO, Ni3+, Fe3+, Mn3+ and oxygen vacancies in samples. The Ni3+ and Mn3+ antiferromagnetic coupling is responsible for decrease in saturation magnetization Ms from 4.78 to 2.74 µB/f.u as Fe substitution increases from 0.1 to 0.3 at 5K. The increase in grain size, peak broadening and decrease in magnetization of La2Ni1-xFexMnO6thin film samples suggest presence of antisite defects and antisite phase boundary. The present work will helpful to study the effect of B site substitution on La2NiMnO6 thin films structural, electronic and magnetic properties in order to make it suitable candidate for potential applications.
Double perovskite, PLD, raman spectra, antisite defects, antisite phase boundary.