Department of Metallurgical Engineering, National Institute of Technology Raipur 492010, India
Adv. Mater. Lett., 2016, 7 (4), pp 319-324
DOI: 10.5185/amlett.2016.6155
Publication Date (Web): Mar 07, 2016
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E-mail: sksinha.met@nitrr.ac.in
We report the thermal annealing effect of ZnO-SnO2 composite thin films deposited by pulsed laser deposition on its structural, electrical, and optical properties. The results present a consistent portrayal of the evolution of ZnO-SnO2 composite oxide films phase formation in post-annealed condition and its subsequent effect on various physical properties. X-ray diffraction confirms that the films transform from nearly amorphous to fully crystalline state on thermal annealing at 600 °C. X-ray photoelectron spectroscopy reveals a small shift in Sn-3d peak towards lower energy and O-1s and Zn-2p peaks towards higher binding energy with increasing ZnO concentration and confirms the formation of combined oxides of ZnO and SnO2. The average optical transmission is greater than 80 % in the visible region of the annealed ZnO-SnO2 composite films. The lowest electrical resistivity of 9.8 × 10-4 Ωcm has been obtained in the film containing 25 wt % ZnO. Our results suggest that annealed ZnO-SnO2 composite films with improved electrical and optical properties could find potential use in thin film solar cells or touch pad control panels.
X-ray diffraction, crystalline, electrical, transmission, pulsed laser deposition, photoelectron spectroscopy.
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