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Study The Influence Of Different Mol% BLTMNZ Doping On KNLN Ceramics By Using The XRD And Impedance spectroscopy

Shweta Thakur¹, Radheshyam Rai^1*, Seema Sharma² and Ashutosh Tiwari^{3, 4}

¹School of Physics, Shoolini University, Solan 173229, Himachal Pradesh, India

²Ferroelectric Research Laboratory, Department of Physics, A. N. College, Patna 800013, India

³Biosensors and Bioelectronics Centre, IFM, Linkoping University, Linkoping 58183, Sweden

⁴Tekidag AB, UCS, Teknikringen 4A, Mjärdevi Science Park, Linköping 583 30, Sweden

Adv. Mater. Lett., 2016, 7 (1), pp 29-35

DOI: 10.5185/amlett.2016.6001

Publication Date (Web): Dec 22, 2015

E-mail: rshyam1273@gmail.com

Full Article

Abstract

Polycrystalline samples of (K_0.45Na_0.45Li_0.1NbO₃)_1-x-(Ba_0.96La_0.04Ti_0.815Mn_0.0025Nb_0.0025Zr_0.18O₃)_x ceramics (where x = 0.1, 0.3, 0.5, 0.7 and 0.9) were prepared by using a high temperature solid state reaction technique. The XRD patterns of the BLTMNZ doped KNLN at room temperature with x = 0.7 have pure pervoskite phase with tetragonal structure at room temperature and have maximum value of dielectric constant at x = 0.9. Detailed studies of dielectric and impedance properties of the materials in a wide range of frequency (100Hz–1MHz) and temperatures (30 – 500 ^oC) showed that properties are strongly temperature and frequency dependent. The plots of ZÊ¹Ê¹ and MÊ¹Ê¹ versus frequency at various temperatures show peaks in the higher temperature range (>300 ^oC). The compounds show dielectric relaxation, which is found to be of non-Debye type and the relaxation frequency shifted to higher side with increase in temperature. The Nyquist plot and conductivity studies showed the NTCR character of samples.