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Study the influence of different mol% BLTMNZ doping on KNLN ceramics by using the XRD and impedance
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Study The Influence Of Different Mol% BLTMNZ Doping On KNLN Ceramics By Using The XRD And Impedance spectroscopy
Shweta Thakur1, Radheshyam Rai1*, Seema Sharma2 and Ashutosh Tiwari3, 4
1School of Physics, Shoolini University, Solan 173229, Himachal Pradesh, India
2Ferroelectric Research Laboratory, Department of Physics, A. N. College, Patna 800013, India
3Biosensors and Bioelectronics Centre, IFM, Linkoping University, Linkoping 58183, Sweden
4Tekidag AB, UCS, Teknikringen 4A, Mjärdevi Science Park, Linköping 583 30, Sweden
Polycrystalline samples of (K0.45Na0.45Li0.1NbO3)1-x-(Ba0.96La0.04Ti0.815Mn0.0025 Nb0.0025Zr0.18 O3)x ceramics (where x = 0.1, 0.3, 0.5, 0.7 and 0.9) were prepared by using a high temperature solid state reaction technique. The XRD patterns of the BLTMNZ doped KNLN at room temperature with x = 0.7 have pure pervoskite phase with tetragonal structure at room temperature and have maximum value of dielectric constant at x = 0.9. Detailed studies of dielectric and impedance properties of the materials in a wide range of frequency (100Hz–1MHz) and temperatures (30 – 500 oC) showed that properties are strongly temperature and frequency dependent. The plots of Zʹʹ and Mʹʹ versus frequency at various temperatures show peaks in the higher temperature range (>300 oC). The compounds show dielectric relaxation, which is found to be of non-Debye type and the relaxation frequency shifted to higher side with increase in temperature. The Nyquist plot and conductivity studies showed the NTCR character of samples.
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