MgO; atomic force microscopy; X-ray absorption spectroscopy

Study Of Surface Morphology And Grain Size Of Irradiated MgO Thin Films

Jitendra Pal Singh1*, I. Sulania1, Jai Prakash1, 2, S. Gautam3, K. H. Chae3, D. Kanjilal1, K. Asokan1

1Inter University Accelerator Centre, Aruna Asaf Ali Marg, New Delhi 110067, India

2Depertment of Chemistry, MMH College Ghaziabad (CCS University, Meerut), Uttar Pradesh 201001, India

3Nano Analysis Center, Korea Institute of Science and Technology (KIST), Seoul 136 791, Republic of Korea

Adv. Mater. Lett., 2012, 3 (2), pp 112-117

DOI: 10.5185/amlett.2012.1307

Publication Date (Web): Apr 14, 2012



Present work reports 200 MeV Ag15+ irradiation induced effects on the surface morphology, grain size and local electronic structure in MgO thin films deposited by e-beam evaporation under ultra High vacuum. The grain size was found to decrease from 37 nm (pristine film) to 23 nm for the sample irradiated with fluence of 1×1012 ions/cm2 and thereafter it increases upto fluence of 5×1012 ions/cm2. Similar changes with ion fluence were also observed for surface roughness. Shifting and disappearance of peaks in X-ray absorption spectra with irradiation shows the electronic structure modification after irradiation. The detailed analysis of observed results has been done on the basis of existing theories.


MgO, atomic force microscopy, X-ray absorption spectroscopy

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