Cover Page December-2019-Advanced Materials Letters

Advanced Materials Letters

Volume 10, Issue 12, Pages 868-873, December 2019
About Cover

IAAM recognizes the contribution of scientists towards the advancement of materials to global excellence with the ‘Researcher of the year’ award every year. Prof. Zhong Lin (Z. L.) Wang from Georgia Tech., USA and Prof. T. Venkatesan from Nano Core Research Center at National University of Singapore were recognized with this prestigious award in 2017 and 2018, respectively. This year, the award is presented to eminent physicist Prof. Enge Wang, Vice President of Chinese Academy of Sciences (CAS) and President Emeritus of Peking University, China, for his contribution towards the nanotechnology research and innovations. Advanced Materials Letters feels very honored and privileged to confer upon him the ‘Researcher of the Year’ award and dedicate the cover photo of December 2019 issue for his several years of diligence and uncountable achievements.


Dual Effect of Light Irradiation for Surface Relief Gratings Formation in Se-rich Ge-Se Thin Films

Tyler Nichol1, Janis Teteris2, Mara Reinfelde2, Maria Mitkova1,*

1Department of Electrical and Computer Engineering, Boise State University, Boise, ID 83725-2075, USA  

2Institute of Solid State Physics, University of Latvia, Riga, Latvia

Adv. Mater. Lett., 2019, 10 (12), pp 868-873

DOI: 10.5185/amlett.2019.0012

Publication Date (Web): May 16, 2019

Corresponding author: mariamitkova@boisestate.edu

Abstract

Relief surface formation as a result of light irradiation is one important property of chalcogenide glasses which gives rise of number of applications. Understanding the nature of the process is an essential step towards optimization of the relief images obtained. This work depicts the mechanisms for surface relief grating formation in Ge-Se thin films exposed to diffracted light. A dependence on the period of the illumination source is revealed, which correlates with the composition of the thin film material. Raman spectroscopy, Energy Dispersive Spectroscopy (EDS), and Atomic Force Microscopy (AFM) were used to analyze the films. The results point towards a dual effect of light irradiation leading to mass transport and structural changes, which results in a surface relief formation. © VBRI Press.

Keywords

Chalcogenide glass, thin film, surface relief grating, diffraction, mass transport.

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